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Design for test, Design-for-Test (DFT) discussion, education, and best-practices, including Scan, ATPG, BIST, Memory BIST, Logic BIST, Test Compression, ...
www.dftdigest.com - 2009-02-08
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jtag interface
dft
bist
design for test
design
ieee 1149.1
bsdl
boundary scan
jtag
isp
arm
embedded
dfm
dich
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